| Customization: | Available |
|---|---|
| After-sales Service: | 1 Year |
| Warranty: | 1 Year |
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The equipment is mainly based on Transient Line-Source Technique in testing materials thermal conductivity, thermal resistance and thermal diffusivity by probe. It is widely used in electricity, automobile, material, biology pharmacy and other fields. Provide with multiple probe, software, devices and supporting, can used for testing thermal conduction performance of various types of materials.
Main technical parameters:
| Thermal conductivity | 0.005-300 W/m.K |
| Temperature scope | RT ~ 40 °C, resolution: 0.1ºC |
| Material type | Metal, alloy, ceramics, ore, composite materials, silicon wafer, polymer, binder, paper, fabric, printed circuit board, propellant... |
| Test module | basic, thin film, plate, anistropy, single face, specific heat |
| Probe size | 1# Probe Φ7.5mm, and 2# probe Φ15 mm |
| Specimen type | Solid, powder, film, coating material, etc. |
| Accuracy | 5 % |
| Reproducibility | 3% |
| Sample thickness | 0.01~5mm |
| Data result analysis | Automatic thermal analysis software, Windows 10/7/XP English |
| Supply voltage | AC 220V±5%, power: 3.0kw |
| Main configurations | DRX-II-PS testing host, probe, testing box, testing software, communication cable. |
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